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Hitachi S-Type pre-aligned Filaments with Metal Cartridge for S-3400N, S-3700N, SU-1500, SU-15210, SU-3500 and TM33030-3000-1000 series Table top SEM - Rave Scientific
![4: Picture of a Hitachi S-3400N SEM EM and b Hitachi S-4700N FESEM located | Download Scientific Diagram 4: Picture of a Hitachi S-3400N SEM EM and b Hitachi S-4700N FESEM located | Download Scientific Diagram](https://www.researchgate.net/publication/344955034/figure/fig9/AS:952026418667532@1603992194341/4-Picture-of-a-Hitachi-S-3400N-SEM-EM-and-b-Hitachi-S-4700N-FESEM-located.png)
4: Picture of a Hitachi S-3400N SEM EM and b Hitachi S-4700N FESEM located | Download Scientific Diagram
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TEi Metallurgical Laboratory invests in new Scanning Electron Microscope (SEM) for failure analyses | TEi
![9: Scanning electron microscope (SEM) (Hitachi S3400N) used to observe... | Download Scientific Diagram 9: Scanning electron microscope (SEM) (Hitachi S3400N) used to observe... | Download Scientific Diagram](https://www.researchgate.net/publication/339552722/figure/fig19/AS:863470895509505@1582878912167/Scanning-electron-microscope-SEM-Hitachi-S3400N-used-to-observe-fracture-surface.jpg)